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文章詳情
IN CIRCUIT and functional tester
- 產(chǎn)品名稱：IN CIRCUIT and functional tester
- 產(chǎn)品型號：Compact SL
- 產(chǎn)品廠商：seica
- 產(chǎn)品文檔：
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簡單介紹
This configuration offers a completely automated solution via an integrated, SMEMA-compatible conveyor system, allowing completely automatic board handling and easy integration into high volume production lines. Configurable as ICT,
IN CIRCUIT and functional tester
的詳細(xì)介紹This configuration offers a completely automated solution via an integrated, SMEMA-compatible conveyor system, allowing completely automatic board handling and easy integration into high volume production lines. Configurable as ICT, pre-functional, functional and combinational. The compact footprint and the compliance with WCM criteria, enable easy and successful integration both in-line and/or within an automated test island. Cost reduction and high throughput guaranteed.
Compact SL is particularly suitable for:
- parametric and in-circuit tests
- functional tests
- On-board programming
- In-line integration
- High-volume production
- Automated test islands
- Operator-free use
- Handling costs reduction
Features
- Up to 1536 analog channels
- Up to 128 hybrid channels (digital channel up to 10 MHz)
- Reaching Up to 6 user power supply units
- 2-JOB paralllel test with standard cabinet
- 4-JOB parallel test with double cabinet
- OPENFIX for open pin identification on digital components and connectors
- Universal on-board programmer (up to 8 in parallel)
- Boundary-scan test
- Self-test at the module level
- Receiver with pneumatic press and upper contrasts
- Off-line Programming and Repair Stations
- barcode and 2D code reading management; automatic statistic data collection
- Automated programming via CAD data import